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Madrid System e-Services - Madrid Monitor
Quick-Start Guide
Use Madrid Monitor to track the status of your international application or registration, access detailed information on all trademarks registered through the Madrid System, and keep an eye on competitor's marks.
Publication year: 2017
Madrid System e-Services
The tools you need to protect your trademark. Globally.
An overview of Madrid System online tools and resources available to support trademark owners at each stage of the international trademark registration lifecycle (search, file, monitor and manage). Contains descriptions of each tool, including when and why to use it and a list of key benefits and features.
Madrid Yearly Review 2017
International Registration of Marks
Comprehensive facts, figures and analysis of the international registration of marks.
Making a Mark: An Introduction to Trademarks for Small and Medium-Sized Enterprises
Distinctive signs enable a company to distinguish its products and services from those of other companies. Trademarks provide protection for these signs allowing companies to create visibility and build their brand image. This guide explains the trademark system and the importance of trademark management.
WIPO IP Facts and Figures 2014
An overview of intellectual property activity based on the latest available year of complete statistics.
Publication year: 2015
WIPO IP Facts and Figures 2016
World Intellectual Property Indicators - 2016
A comprehensive picture of IP activity around the world based on statistics from national and regional IP offices, WIPO and the World Bank. Covers filing, registration and renewals data for patents, utility models, trademarks, industrial designs, microorganisms and plant variety protection. Also includes an analysis of participation by women inventors in international patenting.
Publication year: 2016
Madrid System for the International Registration of Marks 2006
Publication year: 2007
Madrid System for the International Registration of Marks 2007
Publication year: 2008
Madrid System for the International Registration of Marks 2008
Publication year: 2009