|Date and venue||October 11 to October 12, 2004 (Geneva, Switzerland)|
|Previous / future meetings||WIPO-OECD/STAT/04 >> WIPO-OECD/STAT/05|
|Topic(s)||Patent Statistics-related Meetings, Workshops and Seminars|
|The Workshop will focus on both empirical analysis and statistical issues, covering the following themes: spillovers and diffusion of knowledge, value of patents, new ways of using patent data to address policy issues, forecasting patent data, and patent statistics and indicators.|
Invitations: All interested parties are invited to the meeting.