Patent Statistics-related Meetings

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WIPO-OECD Workshop on the Use of Patent Statistics

WIPO-OECD/STAT/04
October 11 to October 12, 2004 (Geneva, Switzerland)
The Workshop will focus on both empirical analysis and statistical issues, covering the following themes: spillovers and diffusion of knowledge, value of patents, new ways of using patent data to address policy issues, forecasting patent data, and patent statistics and indicators.