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Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo

Document CodeSCT/IS/ID/GE/17/INF/2
Related Meeting(s)SCT/IS/ID/GE/17
Publication DateNovember 3, 2017
EnglishMr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo
Complete document
Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo, single (pdf)
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