Regional Workshop on Patent Examination Quality Management

会议代码WIPO/IP/TYO/17
日期和地点2017年6月21日 至 6月23日 (东京, 日本)
主题知识产权, 讲习班与研讨会, 日本工业产权信托基金-全球

会议文件

代码名称文件
WIPO/IP/TYO/17/INF/1EnglishProgramProgram, 完整文件 (pdf)

其他相关文件

名称文件
WIPO/IP/TYO/17/1EnglishQuality of Patents - Mr. Ken-Ichiro Natsume, Director, PCT International Cooperation Division, WIPOQuality of Patents - Mr. Ken-Ichiro Natsume, Director, PCT International Cooperation Division, WIPO, 完整文件 (pdf)
WIPO/IP/TYO/17/2EnglishQuality Management System for Patent Examination at the JPO - Mr. Hiromi Takaoka, Director, Quality Management Office, Japan Patent OfficeQuality Management System for Patent Examination at the JPO - Mr. Hiromi Takaoka, Director, Quality Management Office, Japan Patent Office, 完整文件 (pdf)
WIPO/IP/TYO/17/3EnglishFor better quality of Patent Examination-Based on our Experiences - Mr. Masahiko Fukumoto, Vice Director of International Activity Center of Japan Patent Attorneys Association (JPAA)For better quality of Patent Examination-Based on our Experiences - Mr. Masahiko Fukumoto, Vice Director of International Activity Center of Japan Patent Attorneys Association (JPAA), 完整文件 (pdf)
WIPO/IP/TYO/17/6EnglishQuality Management at the International Arena and Approach to Substantive Patent Examination - Mr. Ken-Ichiro Natsume, WIPOQuality Management at the International Arena and Approach to Substantive Patent Examination - Mr. Ken-Ichiro Natsume, WIPO, 完整文件 (pdf)
WIPO/IP/TYO/17/9EnglishUnderstanding method ofUser Needs at the JPO - Mr. Yasunori Shimizu, Deputy Director, Quality Management Office, JPOUnderstanding method ofUser Needs at the JPO - Mr. Yasunori Shimizu, Deputy Director, Quality Management Office, JPO, 完整文件 (pdf)
WIPO/IP/TYO/17/10EnglishIntroduction to the Group Discussion - Mr. Ken-Ichiro Natsume, WIPOIntroduction to the Group Discussion - Mr. Ken-Ichiro Natsume, WIPO, 完整文件 (pdf)
WIPO/IP/TYO/17/11EnglishIntroduction to the Group Discussion - Mr. Ken-Ichiro Natsume, WIPOIntroduction to the Group Discussion - Mr. Ken-Ichiro Natsume, WIPO, 完整文件 (pdf)
WIPO/IP/TYO/17/12.1EnglishHigh-Quality Patents, from the Comparison of IP5 description requirement judgments in notice of reasons for rejection - Mr. Akihiro Otsuka, WG leader, International Policy PJ, Japan Intellectual Property Association (JIPA)High-Quality Patents, from the Comparison of IP5 description requirement judgments in notice of reasons for rejection - Mr. Akihiro Otsuka, WG leader, International Policy PJ, Japan Intellectual Property Association (JIPA), 完整文件 (pdf)
WIPO/IP/TYO/17/12.2EnglishHigh-Quality Patents, from the Study about JP-US Collaborative Search Pilot Program(JP-US CSP)- Mr. Katsuyuki SHIBATA, Vice Chairman, 1st patent committee, Japan Intellectual Property Association (JIPA)High-Quality Patents, from the Study about JP-US Collaborative Search Pilot Program(JP-US CSP)- Mr. Katsuyuki SHIBATA, Vice Chairman,
1st patent committee,
Japan Intellectual Property Association (JIPA), 完整文件 (pdf)