Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo
| Code du document | SCT/IS/ID/GE/17/INF/2 |
| Réunion(s) connexe(s) | SCT/IS/ID/GE/17 |
| Date de publication | 3 novembre 2017 |
| English | Mr. Hiroyuki Ito, Director, Design Examination Planning, Design Division, Japan Patent Office (JPO), Tokyo |