Taller sobre la Clasificación Internacional de Patentes (CIP)

CódigoIPC/WK/GE/17
Fecha y lugar21 de febrero de 2017 (Ginebra, Suiza)
Reuniones anteriores / futurasIPC/WK/GE/13 >> IPC/WK/GE/17
Tema(s)Clasificación Internacional de Patentes (CIP), Seminarios relativos a la CIP, Talleres y seminarios

Más información

Documentos de reunión

CódigoTítulo(s)Fichero(s)
IPC/WK/GE/17/1EnglishFinal ProgramFinal Program, Documento completo (doc) Final Program, Documento completo (pdf)

Otros documentos conexos

 Título(s)Fichero(s)
IPC/WK/GE/17/IPC_272EnglishInvitation CircularInvitation Circular, Documento completo (pdf)
IPC/WK/GE/17/IPC_270_271EnglishInvitation CircularInvitation Circular, Documento completo (pdf)
IPC/WK/GE/17/ITEM2/1/WIPOEnglishRecent Developments in the IPC – Mr. Rastislav MarčokRecent Developments in the IPC – Mr. Rastislav Marčok, Documento completo (pdf)
IPC/WK/GE/17/ITEM2/2/WIPOEnglishFuture Perspectives of IPC Revision – Ms. Ning XuFuture Perspectives of IPC Revision – Ms. Ning Xu, Documento completo (pdf)
IPC/WK/GE/17/ITEM2/3/JPOEnglishEstablishment of a New Classification Regarding IoT (Internet of Things) – Mr. Masakazu ShiozawaEstablishment of a New Classification Regarding IoT (Internet of Things) – Mr. Masakazu Shiozawa, Documento completo (pdf)
IPC/WK/GE/17/ITEM2/4/EPO_USPTOEnglishRecent Developments in the CPC – Ms. Dimple Bodawala and Mr. Pierre HeldRecent Developments in the CPC – Ms. Dimple Bodawala and Mr. Pierre Held, Documento completo (pdf)
IPC/WK/GE/17/ITEM2/5/USPTOEnglishHarmonization of Classification Practice - Objective Metrics – Mr. Christopher KimHarmonization of Classification Practice - Objective Metrics – Mr. Christopher Kim, Documento completo (pdf)
IPC/WK/GE/17/ITEM2/6/SIPOEnglishClassification Quality Management System at SIPO – Mr. XU YongClassification Quality Management  System at SIPO – Mr. XU Yong, Documento completo (pdf)
IPC/WK/GE/17/ITEM3/1/WIPOEnglishIPC Publication Platform and other IPC-related Electronic Products and Services – Mr. Patrick Fiévet IPC Publication Platform and other IPC-related Electronic Products and Services – Mr. Patrick Fiévet , Documento completo (pdf)
IPC/WK/GE/17/ITEM4/1/PDGEnglishIndustry's Expectation on Classification – Mr. Bernd WolterIndustry's Expectation on Classification – Mr. Bernd Wolter, Documento completo (pdf)
IPC/WK/GE/17/ITEM4/2/PATCOMEnglishThe Value of IPC Codes - The Views from Database Producers and Distributors – Mr. Paul Peters The Value of IPC Codes - The Views from Database Producers and Distributors – Mr. Paul Peters , Documento completo (pdf)
IPC/WK/GE/17/ITEM4/3/SPROEnglishIPC Reclassification - Experiences at the Swedish Patent and Registration Office – Mr. Anders BruunIPC Reclassification - Experiences at the Swedish Patent and Registration Office – Mr. Anders Bruun, Documento completo (pdf)
IPC/WK/GE/17/ITEM5/1/EVALUESERVEEnglishAutomated Patent Classification - What We Have Learned from Client Projects – Mr. Jeroen Kleinhoven and Mr. Fedde van der LijnAutomated Patent Classification - What We Have Learned from Client Projects – Mr. Jeroen Kleinhoven and Mr. Fedde van der Lijn, Documento completo (pdf)
IPC/WK/GE/17/ITEM5/2/SIMPLE_SHIFTEnglishAutomatic Categorization: Future Perspectives – Mr. Jacques Guyot Automatic Categorization: Future Perspectives – Mr. Jacques Guyot , Documento completo (pdf)