PCT Union - Meeting of International Authorities under the Patent Cooperation Treaty (PCT)

Twenty-Third Session

CódigoPCT/MIA/23
Fecha y lugar20 de enero a 22 de enero de 2016 (Santiago, Chile)
Reuniones anteriores / futurasPCT/MIA/22 >> PCT/MIA/23 >> PCT/MIA/24
Tema(s)Reunión de las Administraciones Internacionales según el PCT (PCT/MIA), Talleres y seminarios

Documentos de reunión

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  • English ZIP
CódigoTítulo(s)Fichero(s)
PCT/MIA/23/1 REV.EnglishRevised Draft AgendaRevised Draft Agenda, Documento completo (doc) Revised Draft Agenda, Documento completo (pdf)
PCT/MIA/23/2EnglishEffective Work Sharing Beyond International Reports: Utilization of the WIPO CASE PlatformEffective Work Sharing Beyond International Reports:  Utilization of the WIPO CASE Platform, Documento completo (doc) Effective Work Sharing Beyond International Reports:  Utilization of the WIPO CASE Platform, Documento completo (pdf)
PCT/MIA/23/3EnglishTransmittal by the Receiving Office of Earlier Search and/or Classification Results to the International Searching AuthorityTransmittal by the Receiving Office of Earlier Search and/or Classification Results to the International Searching Authority, Documento completo (doc) Transmittal by the Receiving Office of Earlier Search and/or Classification Results to the International Searching Authority, Documento completo (pdf)
PCT/MIA/23/4EnglishPossible Improvements to the Supplementary International Search SystemPossible Improvements to the Supplementary International Search System, Documento completo (doc) Possible Improvements to the Supplementary International Search System, Documento completo (pdf)
PCT/MIA/23/5EnglishPCT Minimum Documentation: Definition and Extent of Patent LiteraturePCT Minimum Documentation:  Definition and Extent of Patent Literature, Documento completo (doc) PCT Minimum Documentation:  Definition and Extent of Patent Literature, Documento completo (pdf)
PCT/MIA/23/6EnglishPCT Online ServicesPCT Online Services, Documento completo (doc) PCT Online Services, Documento completo (pdf)
PCT/MIA/23/7EnglishPCT Sequence Listing StandardPCT Sequence Listing Standard, Documento completo (doc) PCT Sequence Listing Standard, Documento completo (pdf)
PCT/MIA/23/8EnglishPromoting Linkage Between the International Phase and the National PhasePromoting Linkage Between the International Phase and the National Phase, Documento completo (doc) Promoting Linkage Between the International Phase and the National Phase, Documento completo (pdf)
PCT/MIA/23/9EnglishReappointment of Existing International AuthoritiesReappointment of Existing International Authorities, Documento completo (doc) Reappointment of Existing International Authorities, Documento completo (pdf)
PCT/MIA/23/10EnglishPCT Minimum Documentation: Indian Traditional Knowledge Digital LibraryPCT Minimum Documentation: Indian Traditional Knowledge Digital Library, Documento completo (doc) PCT Minimum Documentation: Indian Traditional Knowledge Digital Library, Documento completo (pdf)
PCT/MIA/23/11EnglishRevision of WIPO Standard ST.14Revision of WIPO Standard ST.14, Documento completo (doc) Revision of WIPO Standard ST.14, Documento completo (pdf)
PCT/MIA/23/12EnglishCollaborative Search and Examination Third PilotCollaborative Search and Examination Third Pilot, Documento completo (doc) Collaborative Search and Examination Third Pilot, Documento completo (pdf)
PCT/MIA/23/13EnglishPCT Direct: A New Service Strengthening the Use of the PCTPCT Direct: A New Service Strengthening the Use of the PCT, Documento completo (doc) PCT Direct: A New Service Strengthening the Use of the PCT, Documento completo (pdf)
PCT/MIA/23/14EnglishSummarySummary, Documento completo (doc) Summary, Documento completo (pdf)

Otros documentos conexos

 Título(s)Fichero(s)
PCT/MIA/23/WWW/327156EnglishPCT StatisticsPCT Statistics, Documento completo (pdf) PCT Statistics, Documento completo (ppt)
PCT/MIA/23/WWW/327176EnglishIntroduction of "Handbook for PCT International Search and Preliminary Examination in the Japan Patent Office"Introduction of "Handbook for PCT International Search and Preliminary Examination in the Japan Patent Office", Documento completo (pdf)