| WIPO/IP/TYO/17/1 | English | Quality of Patents - Mr. Ken-Ichiro Natsume, Director, PCT International Cooperation Division, WIPO |  |
| WIPO/IP/TYO/17/2 | English | Quality Management System for Patent Examination at the JPO - Mr. Hiromi Takaoka, Director, Quality Management Office, Japan Patent Office | |
| WIPO/IP/TYO/17/3 | English | For better quality of Patent Examination-Based on our Experiences - Mr. Masahiko Fukumoto, Vice Director of International Activity Center of Japan Patent Attorneys Association (JPAA) | |
| WIPO/IP/TYO/17/6 | English | Quality Management at the International Arena and Approach to Substantive Patent Examination - Mr. Ken-Ichiro Natsume, WIPO | |
| WIPO/IP/TYO/17/9 | English | Understanding method ofUser Needs at the JPO - Mr. Yasunori Shimizu, Deputy Director, Quality Management Office, JPO | |
| WIPO/IP/TYO/17/10 | English | Introduction to the Group Discussion - Mr. Ken-Ichiro Natsume, WIPO | |
| WIPO/IP/TYO/17/11 | English | Introduction to the Group Discussion - Mr. Ken-Ichiro Natsume, WIPO | |
| WIPO/IP/TYO/17/12.1 | English | High-Quality Patents, from the Comparison of IP5 description requirement judgments in notice of reasons for rejection - Mr. Akihiro Otsuka, WG leader, International Policy PJ, Japan Intellectual Property Association (JIPA) | |
| WIPO/IP/TYO/17/12.2 | English | High-Quality Patents, from the Study about JP-US Collaborative Search Pilot Program（JP-US CSP）- Mr. Katsuyuki SHIBATA, Vice Chairman,
1st patent committee,
Japan Intellectual Property Association (JIPA) | |