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WIPO Workshop on Examination in the PCT National Phase

February 27, 2020

A training workshop for patent examiners took place from February 3 to 6, 2020, in Pretoria, South Africa. The event was organized by WIPO in cooperation with the Companies and Intellectual Property Commission (CICP) and with the assistance of the Japan Patent Office (JPO).

The objective of the workshop was to learn about and discuss the best approaches to conduct the substantive examination of PCT international applications in the national phase.

About the workshop

During the workshop, participants learned in particular how to research patent family information, analyze examination status in different national phases, and retrieve and compare citation and dossier information of family members by using the said platforms and other databases and tools, such as, Espacenet, J-PlatPat, PATENTSCOPE, US Public Pair and the Common Citation Document.

Participants also learned about the PPH scheme as a work sharing initiative and the JPO’s examination practice in its national phase.

Lecture by Mr. Lutz Mailänder, Head, Cooperation on Examination and Training Section, PCT International Cooperation Division, WIPO (Photo: JPO/Nakano Hiroyuki)
Lecture by Mr. NAKANO Hiroyuki, Deputy Director, Examination Policy Planning Office, Administrative Affairs Division, JPO (Photo: WIPO/Lutz Mailander)
Participants (Photo: JPO/Nakano Hiroyuki)

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