(WO/2008/021834) HIGH-RESOLUTION MICROSCOPE USING OPTICAL AMPLIFICATION
- Biblio. Data
- Description
- Claims
- National Phase
- Notices
- Documents
| Latest bibliographic data on file with the International Bureau
| ||||||||||||
| ||||||||||||
| IPC: | G02B 21/06 (2006.01), G01N 21/64 (2006.01) | |||||||||||
| Applicants: | THE REGENTS OF THE UNIVERSITY OF CALIFORNIA [US/US]; 1111 Franklin Street, 12th Floor, Oakland, California 94607 (US) (All Except US). LIU, Jia-Ming [US/US]; (US) (US Only). STEFANI, Enrico [US/US]; (US) (US Only). | |||||||||||
| Inventors: | LIU, Jia-Ming; (US). STEFANI, Enrico; (US). | |||||||||||
| Agent: | GRAY, Gerald, T. et al.; TOWNSEND and TOWNSEND and CREW LLP, Two Embarcadero Center, Eighth Floor, San Francisco, California 94111-3834 (US). | |||||||||||
| Priority Data: |
| |||||||||||
| Title: | HIGH-RESOLUTION MICROSCOPE USING OPTICAL AMPLIFICATION | |||||||||||
| Abstract: | Systems and methods that enhance the resolution of a microscope in all three spatial dimensions. A microscope system is provided that typically includes a first objective lens (20), an illumination source that provides excitation illumination (λex) at a first wavelength through the objective lens (20) in a first direction onto a fluorescent sample so as to induce fluorescent emission in the sample at a second wavelength (λfI) different than the first wavelength. The system also typically includes an element (60) that provides illumination at the second wavelength (λfl) to the sample in a second direction different from the first direction, and a detector (10) for detecting the fluorescent emission. The optical gain of the fluorescent emission at the second wavelength is enhanced through stimulated emission. | |||||||||||
| Designated States: |
AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW) Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM) European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, PL, PT, RO, SE, SI, SK, TR) African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG). | |||||||||||
| Publication Language: | English (EN) |
| Filing Language: | English (EN) |

