(WO/2007/079411) ALIGNMENT, TRANSPORTATION AND INTEGRATION OF NANOWIRES USING OPTICAL TRAPPING

(WO/2007/079411) ALIGNMENT, TRANSPORTATION AND INTEGRATION OF NANOWIRES USING OPTICAL TRAPPING

Latest bibliographic data on file with the International Bureau
Pub. No.:  WO/2007/079411   International Application No.:  PCT/US2006/062727
Publication Date:12.07.2007 International Filing Date:29.12.2006
IPC: G02B 27/30 (2006.01)
Applicants:THE REGENTS OF THE UNIVERSITY OF CALIFORNIA [US/US]; 1111 Franklin Street, 12th Floor, Oakland, CA 94607 (US) (All Except US).
PAUZAUSKIE, Peter [US/US]; (US) (US Only).
REDENOVIC, Alexandra [HR/US]; (HR) (US Only).
TREPAGNIER, Eliane [US/US]; (US) (US Only).
LIPHARDT, Jan [DE/US]; (US) (US Only).
YANG, Peidong [CN/US]; (US) (US Only).
Inventors:PAUZAUSKIE, Peter; (US).
REDENOVIC, Alexandra; (HR).
TREPAGNIER, Eliane; (US).
LIPHARDT, Jan; (US).
YANG, Peidong; (US).
Agent:O'BANION, John, P.; O'BANION & RITCHEY LLP, 400 CAPITOL MALL, Suite 1550, Sacramento, CA 95814 (US).
Priority Data:
60/755,283 30.12.2005 US
Title: ALIGNMENT, TRANSPORTATION AND INTEGRATION OF NANOWIRES USING OPTICAL TRAPPING
Abstract: Individually trapping, transferring, and assembling high-aspect-ratio semiconductor nanowires into arbitrary structures in a fluid environment. Nanowires with diameters as small as 20 nm and aspect ratios of above 100 can be trapped and transported in three dimensions, enabling the construction of nanowire architectures which may function as active photonic devices. Moreover, nanowire structures can now be assembled in physiological environments. In one aspect, nanowires are positioned to direct light to remote samples, reducing exposure of the overall sample to intense source illumination. A tunable nanowire probe for subwavelength imaging is also described utilizing efficient second harmonic generation (SHG) whose optical frequency conversion allows implementing subwavelength microscopes.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language:English (EN)
Filing Language:English (EN)

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