(WO/2006/115716) SYSTEM AND METHOD OF VISIBLE SURFACE DETERMINATION IN COMPUTER GRAPHICS USING INTERVAL ANALYSIS

(WO/2006/115716) SYSTEM AND METHOD OF VISIBLE SURFACE DETERMINATION IN COMPUTER GRAPHICS USING INTERVAL ANALYSIS

Latest bibliographic data on file with the International Bureau
Pub. No.:  WO/2006/115716   International Application No.:  PCT/US2006/012548
Publication Date:02.11.2006 International Filing Date:05.04.2006
Chapter 2 Demand Filed: 09.04.2007
IPC: G06T 15/00 (2006.01), G06T 15/30 (2006.01)
Applicants:SUNFISH STUDIO, LLC [US/US]; 5364 Shoreview Avenue, Minneapolis, Minnesota 55417 (US) (All Except US).
HAYES, Nathan, T. [US/US]; (US) (US Only).
Inventor:HAYES, Nathan, T.; (US).
Agent:STEMPKOVSKI, Richard, C., Jr.; Nawrocki Rooney & Sivertson, P.A., Suite 401, Broadway Place East, 3433 Broadway Street Northeast, Minneapolis, Minnesota 55413 (US).
Priority Data:
60/668,543 05.04.2005 US
Title: SYSTEM AND METHOD OF VISIBLE SURFACE DETERMINATION IN COMPUTER GRAPHICS USING INTERVAL ANALYSIS
Abstract: A system (40) is provided for visible surface determination in furtherance of photorealistic rendering in a computer graphics environment. The system includes a scene database (42) and a processor, visual characteristics of objects (64) of an image frame (44) of a scene of the scene database (42) are delimited as geometric primitives, more particularly, non linear functions. The processor, for executing an interval analysis, to a user degree of certainty, accurately and deterministically ascertains a visible solution set of an area not exceeding a pixel dimension for a pixel (50) of an array (62) of pixels (50) that form said image frame (44). Hierarchical occlusion buffering, in combination with an interleaved interval contraction are advantageously utilized to greatly reduce processing time.
Designated States: AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, LY, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SM, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW.
African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, NL, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language:English (EN)
Filing Language:English (EN)

PATENTSCOPE®

Related Links

E-Newsletters