(WO/2006/033171) OPHTHALMOLOGIC EXAMINATION INSTRUMENT
- Biblio. Data
- Description
- Claims
- National Phase
- Notices
- Documents
| Latest bibliographic data on file with the International Bureau
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| IPC: | A61B 3/10 (2006.01) | |||||||||||
| Applicants: | KASHIWAGI, Kenji [JP/JP]; (JP). TAKAGI SEIKO CO., LTD. [JP/JP]; 330-2, Ooaza Iwafune Nakano-shi Nagano 383-8585 (JP) (All Except US). ABE, Takashi [JP/JP]; (JP) (US Only). TAGAWA, Kouji [JP/JP]; (JP) (US Only). YODA, Masashi [JP/JP]; (JP) (US Only). NAKAYAMA, Junji [JP/JP]; (JP) (US Only). KANAZAWA, Shigeo [JP/JP]; (JP) (US Only). | |||||||||||
| Inventors: | KASHIWAGI, Kenji; (JP). ABE, Takashi; (JP). TAGAWA, Kouji; (JP). YODA, Masashi; (JP). NAKAYAMA, Junji; (JP). KANAZAWA, Shigeo; (JP). | |||||||||||
| Agent: | WATANUKI, Takao; Cre-A Center Bldg. 12-9, Nakagosho 3-chome Nagano-shi Nagano 380-0935 (JP). | |||||||||||
| Priority Data: |
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| Title: |
(EN) OPHTHALMOLOGIC EXAMINATION INSTRUMENT (JA) 眼科用検査装置 | |||||||||||
| Abstract: |
(EN) An ophthalmologic examination instrument (20) for examining an ophthalmologic disease of an eye to be examined by detecting the cross-sectional shape at the anterior part thereof is characterized by comprising a light projection optical system for projecting light toward the anterior part of the eye to be examined while moving the light to scan the peripheral part of the iris from the pupil region, an imaging optical system for receiving the light projected from the light projection optical system and reflected from the anterior part, and a data analysis section for analyzing the shape of the anterior part of the eye by analyzing the light received by the imaging optical system. (JA) 被検眼の前眼部の断面形状を検知することにより被検眼の眼科疾患を検査するための眼科用検査装置２０であって、被検眼の前眼部に向け、瞳孔領から虹彩の周辺部にわたり光を走査させるように移動させながら投射する光投射光学系と、該光投射光学系によって投射された光が前眼部から反射される光を受光する撮影光学系と、該撮影光学系によって受光された光を解析して、被検眼の前眼部の形状を解析するデータ解析部とを備えていることを特徴とする。 | |||||||||||
| Designated States: |
AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, HR, HU, ID, IL, IN, IS, KE, KG, KP, KR, KZ, LC, LK, LR, LS, LT, LU, LV, MA, MD, MG, MK, MN, MW, MX, MZ, NA, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RU, SC, SD, SE, SG, SK, SL, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, YU, ZA, ZM, ZW. African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW) Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM) European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LU, MC, NL, PL, PT, RO, SE, SI, SK, TR) African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG). | |||||||||||
| Publication Language: | Japanese (JA) |
| Filing Language: | Japanese (JA) |
