(WO/2008/100462) MEMORY ARRAY ERROR CORRECTION APPARATUS, SYSTEMS, AND METHODS

(WO/2008/100462) MEMORY ARRAY ERROR CORRECTION APPARATUS, SYSTEMS, AND METHODS

Latest bibliographic data on file with the International Bureau
Pub. No.:  WO/2008/100462   International Application No.:  PCT/US2008/001775
Publication Date:21.08.2008 International Filing Date:11.02.2008
IPC: G06F 11/10 (2006.01)
Applicants:MICRON TECHNOLOGY, INC. [US/US]; 8000 So. Federal Way, Boise, Idaho 83716-9632 (US) (All Except US).
SCHRECK, John F. [US/US]; (US) (US Only).
DAUENBAUGH, Todd A. [US/US]; (US) (US Only).
Inventors:SCHRECK, John F.; (US).
DAUENBAUGH, Todd A.; (US).
Agent:CLISE, Timothy B et al.; Schwegman, Lundberg & Woessner, P.A., P.O. Box 2938, Minneapolis, Minnesota 55402 (US).
Priority Data:
11/705,190 12.02.2007 US
Title: MEMORY ARRAY ERROR CORRECTION APPARATUS, SYSTEMS, AND METHODS
Abstract: Various embodiments include apparatus, methods, and systems that operate to extend the processes of reading, modifying, and writing data stored in or being provided to a memory array without interrupting a continual stream of data to be written into the memory array. Embodiments may include an apparatus comprising a memory array, and an error code module coupled to the memory array with a data buffer having a plurality of data burst registers operable to receive a plurality of data bursts to be written to the memory array on a corresponding plurality of consecutive clock cycles. The error code module is operable to perform a read/modify/write process on each of the plurality of data bursts within a time period no longer than a period of two consecutive cycles of the plurality of consecutive clock cycles.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language:English (EN)
Filing Language:English (EN)

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