(WO/2008/008169) USING ELECTRICAL PROBES FOR DETECTING IMPURITIES IN REACTOR SYSTEMS
- Biblio. Data
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| Latest bibliographic data on file with the International Bureau
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| IPC: | B01J 8/24 (2006.01) | ||||||||||||||||||
| Applicants: | UNIVATION TECHNOLOGIES, LLC [US/US]; 5555 San Felipe, Suite 1950, Houston, TX 77056-2746 (US) (All Except US). MARKEL, Eric, J. [US/US]; (US) (US Only). HAGERTY, Robert, O. [US/US]; (US) (US Only). MUHLE, Michael, E. [US/US]; (US) (US Only). | ||||||||||||||||||
| Inventors: | MARKEL, Eric, J.; (US). HAGERTY, Robert, O.; (US). MUHLE, Michael, E.; (US). | ||||||||||||||||||
| Agent: | ARECHEDERRA, Leandro, III et al.; Univation Technologies, LLC, 5555 San Felipe, Suite 1950, Houston, TX 77056-2746 (US). | ||||||||||||||||||
| Priority Data: |
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| Title: | USING ELECTRICAL PROBES FOR DETECTING IMPURITIES IN REACTOR SYSTEMS | ||||||||||||||||||
| Abstract: | The present invention is directed to various methods and systems for detecting at least one impurity in a bulk fluid (10), using at least one electrical probe (40). The methods are performed in conjunction with a polymerization reactor system (100) such as a gas-phase reactor system. | ||||||||||||||||||
| Designated States: |
AE, AG, AL, AM, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW) Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM) European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, PL, PT, RO, SE, SI, SK, TR) African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG). | ||||||||||||||||||
| Publication Language: | English (EN) |
| Filing Language: | English (EN) |
