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(WO/1999/063311) MULTI-SLIT IMAGING SPECTROMETER
(WO/1999/063311) MULTI-SLIT IMAGING SPECTROMETER
Latest bibliographic data on file with the International Bureau
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| Pub. No.: | | WO/1999/063311 | |
International Application No.: | | PCT/US1999/010154 |
| Publication Date: | 09.12.1999 |
International Filing Date: | 10.05.1999 |
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| IPC: |
G01J 3/04 (2006.01), G01J 3/28 (2006.01) |
| Applicant: | RAYTHEON COMPANY [US/US]; 2000 East El Segundo Boulevard
P.O. Box 902
El Segundo, CA 90245-0902 (US). |
| Inventors: | ANSLEY, David, A.; (US).
COOK, Lacy, G.; (US). |
| Agent: | RAUFER, Colin, M.; Raytheon Company
2000 E. El Segundo Boulevard
P.O. Box 902
El Segundo, CA 90245-0902 (US). |
| Priority Data: | |
| Title: |
MULTI-SLIT IMAGING SPECTROMETER
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| Abstract: |
A multi-slit spectrometer is combined with a two-dimensional detector array (D) to enable simultaneous spectral analysis of several objects, improving the signal-to-noise ratio of multispectral imagery. The multi-slit spectrometer includes a multi-slit structure defining a plurality of parallel thin slits (S, S'), and a first lens (L) for directing object light onto the multi-slit structure. A second lens (C) collimates and directs light which has passed through the slits of the multi-slit structure onto a light dispersing element (P) such as a dispersing prism or a diffraction grating. A third lens (L¿1?) focuses light which has passed through the light dispersing element onto the two-dimensional detector array at an image plane (A). A two-dimensional detector array (D) of detector elements is placed at the image plane. The slits are separated by a separation distance equal to an integral multiple of the detector width dimension, where the multiple is equal to (N times the number of slits) plus or minus one, where N is an integer. In an airborne sensor, a mirror (M) which rotates at an angular velocity related to the velocity of the airborne platform directs object light onto the first lens, freezing the image from one or more objects onto the multi-slit structure for an integration time. |
| Designated States: |
European Patent Office (EPO) (AT, BE, CH, CY, DE, DK, ES, FI, FR, GB, GR, IE, IT, LU, MC, NL, PT, SE).
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| Publication Language: | English (EN) |
| Filing Language: | English (EN) |
