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(WO/2008/112080) DATA ACQUISITION APPARATUS AND METHODOLOGY FOR SELF-DIAGNOSIS OF AC MODULES

(WO/2008/112080) DATA ACQUISITION APPARATUS AND METHODOLOGY FOR SELF-DIAGNOSIS OF AC MODULES

Latest bibliographic data on file with the International Bureau
Pub. No.:  WO/2008/112080   International Application No.:  PCT/US2008/002616
Publication Date:18.09.2008 International Filing Date:27.02.2008
IPC: H02P 9/00 (2006.01)
Applicants:GREENRAY, INC. [US/US]; 7 Littleton Road, E-1, Westford, MA 01886 (US) (All Except US).
LITTLE, Ruel, Davenport [US/US]; (US) (US Only).
KING, Zachary, Adam [US/US]; (US) (US Only).
Inventors:LITTLE, Ruel, Davenport; (US).
KING, Zachary, Adam; (US).
Agent:PANDISCIO, Nicholas, A.; Pandiscio & Pandiscio, P.C., 470 Totten Pond Road, Waltham, MA 02451-1914 (US).
Priority Data:
60/905,393 07.03.2007 US
Title: DATA ACQUISITION APPARATUS AND METHODOLOGY FOR SELF-DIAGNOSIS OF AC MODULES
Abstract: Method and apparatus for monitoring, measuring and recording the operating values of each of a plurality of interconnected AC PV modules and performing a diagnostic analysis, including comparing the those operating values to each other and to operating values recorded at an earlier time to determine laminate degradation and the performance-attenuating effect of temperature, soiling, shading, and snow cover on the modules.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM)
European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR)
African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG).
Publication Language:English (EN)
Filing Language:English (EN)

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