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Search result: 88 of 139 |
(WO/2008/112080) DATA ACQUISITION APPARATUS AND METHODOLOGY FOR SELF-DIAGNOSIS OF AC MODULES
- Biblio. Data
- Description
- Claims
- National Phase
- Notices
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| Latest bibliographic data on file with the International Bureau
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| IPC: | H02P 9/00 (2006.01) | |||||||||||
| Applicants: | GREENRAY, INC. [US/US]; 7 Littleton Road, E-1, Westford, MA 01886 (US) (All Except US). LITTLE, Ruel, Davenport [US/US]; (US) (US Only). KING, Zachary, Adam [US/US]; (US) (US Only). | |||||||||||
| Inventors: | LITTLE, Ruel, Davenport; (US). KING, Zachary, Adam; (US). | |||||||||||
| Agent: | PANDISCIO, Nicholas, A.; Pandiscio & Pandiscio, P.C., 470 Totten Pond Road, Waltham, MA 02451-1914 (US). | |||||||||||
| Priority Data: |
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| Title: | DATA ACQUISITION APPARATUS AND METHODOLOGY FOR SELF-DIAGNOSIS OF AC MODULES | |||||||||||
| Abstract: | Method and apparatus for monitoring, measuring and recording the operating values of each of a plurality of interconnected AC PV modules and performing a diagnostic analysis, including comparing the those operating values to each other and to operating values recorded at an earlier time to determine laminate degradation and the performance-attenuating effect of temperature, soiling, shading, and snow cover on the modules. | |||||||||||
| Designated States: |
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BR, BW, BY, BZ, CA, CH, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IS, JP, KE, KG, KM, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LT, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PG, PH, PL, PT, RO, RS, RU, SC, SD, SE, SG, SK, SL, SM, SV, SY, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW. African Regional Intellectual Property Org. (ARIPO) (BW, GH, GM, KE, LS, MW, MZ, NA, SD, SL, SZ, TZ, UG, ZM, ZW) Eurasian Patent Organization (EAPO) (AM, AZ, BY, KG, KZ, MD, RU, TJ, TM) European Patent Office (EPO) (AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MT, NL, NO, PL, PT, RO, SE, SI, SK, TR) African Intellectual Property Organization (OAPI) (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, ML, MR, NE, SN, TD, TG). | |||||||||||
| Publication Language: | English (EN) |
| Filing Language: | English (EN) |

