World Intellectual Property Organization

OMPI/PI/YAO/13/WWW/228403

Code du documentOMPI/PI/YAO/13/WWW/228403
Réunion(s) connexe(s)OMPI/PI/YAO/13
Date de publication21 janv. 2013
English Topic 1: Challenges and Options in Patent Examination

Mr. Lutz Mailänder, Head, Patent Information Section, Global Information Service, Global Infrastructure Sector, WIPO

Document complet
Topic 1: Challenges and Options in Patent Examination, Document complet (pdf)
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