Conferencias, reuniones y seminarios

OMPI/PI/YAO/13

Título de la reuniónEnglish : WIPO Sub-Regional Workshop on the Utilization of Patent Examination Results of Other Intellectual Property Offices

French : Atelier sous-régional sur l'utilisation des résultats d'examen d'autres offices de propriété intellectuelle à l'intention des examinatuers de brevets

Fecha y lugar30 de enero a 1 de febrero de 2013 (Yaundé, Camerún)

 

Documentos de reunión

CódigoTítulo(s)Fichero(s)
OMPI/PI/YAO/13/INF/1
English : ProgramProgram, Documento completo (pdf)
French : ProgammeProgamme, Documento completo (pdf)

 

Otros documentos conexos

 Título(s)Fichero(s)
Datos adicionales
English : Topic 1: Challenges and Options in Patent ExaminationTopic 1: Challenges and Options in Patent Examination, Documento completo (pdf)
Datos adicionales
English : Topic 2: Patent Family Concepts and Sources of Family Information – part 1Topic 2: Patent Family Concepts and Sources of Family Information – part 1, Documento completo (pdf)
Datos adicionales
English : Exercise A: Checking and Determining the Family Context of Selected Sample Patent Applications (Legal and Technical Families) by Using Respective Information ResourcesExercise A: Checking and Determining the Family Context of Selected Sample Patent Applications (Legal and Technical Families) by Using Respective Information Resources, Documento completo (pdf)
Datos adicionales
English : Topic 3: Retrieving and Utilizing External Results: Types of External ResultsTopic 3: Retrieving and Utilizing External Results: Types of External Results, Documento completo (pdf)
Datos adicionales
English : Topic 4A Sources of External Examination Results: CCD, ESPACENET, US-PAIRTopic 4A Sources of External Examination Results: CCD, ESPACENET, US-PAIR, Documento completo (pdf)
Datos adicionales
English : Exercise B: Retrieving Search/Examination Reports or Granted Patents, and Performing File Inspection for Selected Sample Families by Using CCD, ESPACENET and US-PAIRExercise B: Retrieving Search/Examination Reports or Granted Patents, and Performing File Inspection for Selected Sample Families by Using CCD, ESPACENET and US-PAIR, Documento completo (pdf)
Datos adicionales
English : Topic 4B: Sources of External Examination Results: AIPN, K-PIONTopic 4B: Sources of External Examination Results: AIPN, K-PION, Documento completo (pdf)
Datos adicionales
English : Topic 5: OAPI's experience with utilization of external resultsTopic 5: OAPI's experience with utilization of external results, Documento completo (pdf)
Datos adicionales
English : Topic 6: Claims Drafting: Defining the Scope of Search and ExaminationTopic 6: Claims Drafting: Defining the Scope of Search and Examination, Documento completo (pdf)
Datos adicionales
English : Topic 7: Interpreting and Utilizing Search and Examination ReportsTopic 7: Interpreting and Utilizing Search and Examination Reports, Documento completo (pdf)
Datos adicionales
English : Topic 8: WIPO's ARDI and ASPI programs and the TISC projectTopic 8: WIPO's ARDI and ASPI programs and the TISC project, Documento completo (pdf)
Datos adicionales
English : Exercise D: Exercises on Interpretation of Examination ReportsExercise D: Exercises on Interpretation of Examination Reports, Documento completo (pdf)
Datos adicionales
English : Topic 9: Utilizing Claims of Granted PatentsTopic 9: Utilizing Claims of Granted Patents, Documento completo (pdf)
Datos adicionales
English : Exercise E: Comparative Study on Claims Granted for Different Family Members by Different Intellectual Property Offices (IPOs)Exercise E: Comparative Study on Claims Granted for Different Family Members by Different Intellectual Property Offices (IPOs), Documento completo (pdf)
Datos adicionales
English : Topic 10: Specific Requirements of Patentability and Comparison of Differing National Practices: Exemptions, Unity, Technical Nature, Sufficient Disclosure, Additions to Initial DisclosureTopic 10: Specific Requirements of Patentability and Comparison of Differing National Practices: Exemptions, Unity, Technical Nature, Sufficient Disclosure, Additions to Initial Disclosure, Documento completo (pdf)
Datos adicionales
English : Topic 11: RejectionsTopic 11: Rejections, Documento completo (pdf)

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