Topic 1: Challenges and Options in Patent Examination

Document CodeOMPI/PI/YAO/13/WWW/228403
Related Meeting(s)OMPI/PI/YAO/13
Publication DateJan 21, 2013
English Topic 1: Challenges and Options in Patent Examination

Mr. Lutz Mailänder, Head, Patent Information Section, Global Information Service, Global Infrastructure Sector, WIPO

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