Counterfeiting and Piracy: WIPO/OECD Expert Meeting on Measurement and Statistical Issues

Meeting CodeWIPO-OECD/STAT/05
Date and venueOctober 17 to October 18, 2005 (Geneva, Switzerland)
Previous / future meetingsWIPO-OECD/STAT/04 >> WIPO-OECD/STAT/05
Topic(s)Patent Statistics-related Meetings