Conferences, Meetings and Seminars

Meetings by Topic Patents Patent Statistics-related Meetings

WIPO-OECD/STAT/04 >> WIPO-OECD/STAT/05
Meeting Title	: WIPO-OECD Workshop on the Use of Patent Statistics The Workshop will focus on both empirical analysis and statistical issues, covering the following themes: spillovers and diffusion of knowledge, value of patents, new ways of using patent data to address policy issues, forecasting patent data, and patent statistics and indicators. Invitations: All interested parties are invited to the meeting. : OMPI-OCDE sur l'utilisation des statistiques relatives aux brevets : OMPI-OCDE sobre el uso de estadísticas en materia de patentes
Date and venue	October 11 to October 12, 2004 (Geneva, Switzerland)
Home page	: http://www.wipo.int/meetings/en/2004/statistics_workshop/

WIPO-OECD/STAT/04 >> WIPO-OECD/STAT/05

Meeting Title

: WIPO-OECD Workshop on the Use of Patent Statistics
The Workshop will focus on both empirical analysis and statistical issues, covering the following themes: spillovers and diffusion of knowledge, value of patents, new ways of using patent data to address policy issues, forecasting patent data, and patent statistics and indicators.
Invitations: All interested parties are invited to the meeting.

French : OMPI-OCDE sur l'utilisation des statistiques relatives aux brevets