WIPO-OECD Workshop on the Use of Patent Statistics

Meeting codeWIPO-OECD/STAT/04
Date and venueOctober 11 to October 12, 2004 (Geneva, Switzerland)
Previous / future meetingsWIPO-OECD/STAT/04 >> WIPO-OECD/STAT/05
Topic(s)Patent Statistics-related Meetings, Workshops and Seminars

The Workshop will focus on both empirical analysis and statistical issues, covering the following themes: spillovers and diffusion of knowledge, value of patents, new ways of using patent data to address policy issues, forecasting patent data, and patent statistics and indicators.
Invitations: All interested parties are invited to the meeting.

Meeting documents

WIPO-OECD/STAT/04/1EnglishProgramProgram, Complete document (htm)