World Intellectual Property Organization

WIPO Sub-Regional Workshop on the Utilization of Patent Examination Results of Other Intellectual Property Offices

Meeting CodeOMPI/PI/YAO/13
Date and venueJanuary 30 to February 1, 2013 (Yaoundé, Cameroon)

Meeting Documents

CodeTitle(s)File(s)
OMPI/PI/YAO/13/INF/1EnglishProgramProgram, Complete document (pdf)
FrenchProgammeProgamme, Complete document (pdf)

Other Related Documents

 Title(s)File(s)
OMPI/PI/YAO/13/WWW/228403EnglishTopic 1: Challenges and Options in Patent ExaminationTopic 1: Challenges and Options in Patent Examination, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228404EnglishTopic 2: Patent Family Concepts and Sources of Family Information – part 1Topic 2: Patent Family Concepts and Sources of Family Information – part 1, Complete document (pdf)
OMPI/PI/YAO/13/WWW/2284041EnglishExercise A: Checking and Determining the Family Context of Selected Sample Patent Applications (Legal and Technical Families) by Using Respective Information ResourcesExercise A: Checking and Determining the Family Context of Selected Sample Patent Applications (Legal and Technical Families) by Using Respective Information Resources, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228405EnglishTopic 3: Retrieving and Utilizing External Results: Types of External ResultsTopic 3: Retrieving and Utilizing External Results: Types of External Results, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228406EnglishTopic 4A Sources of External Examination Results: CCD, ESPACENET, US-PAIRTopic 4A Sources of External Examination Results: CCD, ESPACENET, US-PAIR, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228407EnglishExercise B: Retrieving Search/Examination Reports or Granted Patents, and Performing File Inspection for Selected Sample Families by Using CCD, ESPACENET and US-PAIRExercise B: Retrieving Search/Examination Reports or Granted Patents, and Performing File Inspection for Selected Sample Families by Using CCD, ESPACENET and US-PAIR, Complete document (pdf)
OMPI/PI/YAO/13/WWW/2284071EnglishTopic 4B: Sources of External Examination Results: AIPN, K-PIONTopic 4B: Sources of External Examination Results: AIPN, K-PION, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228408EnglishTopic 5: OAPI's experience with utilization of external resultsTopic 5: OAPI's experience with utilization of external results, Complete document (pdf)
OMPI/PI/YAO/13/WWW/2284081EnglishTopic 6: Claims Drafting: Defining the Scope of Search and ExaminationTopic 6: Claims Drafting: Defining the Scope of Search and Examination, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228410EnglishTopic 7: Interpreting and Utilizing Search and Examination ReportsTopic 7: Interpreting and Utilizing Search and Examination Reports, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228411EnglishTopic 8: WIPO's ARDI and ASPI programs and the TISC projectTopic 8: WIPO's ARDI and ASPI programs and the TISC project, Complete document (pdf)
OMPI/PI/YAO/13/WWW/2284111EnglishExercise D: Exercises on Interpretation of Examination ReportsExercise D: Exercises on Interpretation of Examination Reports, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228412EnglishTopic 9: Utilizing Claims of Granted PatentsTopic 9: Utilizing Claims of Granted Patents, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228413EnglishExercise E: Comparative Study on Claims Granted for Different Family Members by Different Intellectual Property Offices (IPOs)Exercise E: Comparative Study on Claims Granted for Different Family Members by Different Intellectual Property Offices (IPOs), Complete document (pdf)
OMPI/PI/YAO/13/WWW/228426EnglishTopic 10: Specific Requirements of Patentability and Comparison of Differing National Practices: Exemptions, Unity, Technical Nature, Sufficient Disclosure, Additions to Initial DisclosureTopic 10: Specific Requirements of Patentability and Comparison of Differing National Practices: Exemptions, Unity, Technical Nature, Sufficient Disclosure, Additions to Initial Disclosure, Complete document (pdf)
OMPI/PI/YAO/13/WWW/228427EnglishTopic 11: RejectionsTopic 11: Rejections, Complete document (pdf)

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