WIPO-OECD Workshop on Statistics in the Patent Field
Geneva, September 18 and 19, 2003
The organization of the WIPO-OECD Workshop was initiated by the OECD Task Force on Patent Statistics which gathers representatives from the following national, regional and international institutions: the Japan Patent Office (JPO), the United States Patent and Trademark Office (USPTO), the National Science Foundation of the United States of America (NSF), the European Patent Office (EPO), the European Commission (EC), and the World Intellectual Property Organization (WIPO), besides the OECD.
It was jointly organized by the World Intellectual Property Organization (WIPO) and the Organisation for Economic Co-operation and Development (OECD) and took place immediately after the WIPO Conference on the Importance of Statistics on Patenting Trends Analysis and Projections.
The WIPO-OECD Workshop provided an opportunity to bring together producers and users of patent statistics to discuss the current state of the art in patent statistics, identify and discuss user needs and determine how the quality and availability of statistics could be improved to better meet user requirements. Particular attention was given to the various types of patent statistics that are currently available and to new approaches regarding patent-based indicators. Emphasis was also placed upon methodologies for the analysis of patent-related information.