World Intellectual Property Organization

Statistics on the Hague, Madrid and PCT Systems

Statistics presented here are drawn from the WIPO Statistics Database.
 

Statistical Data

The WIPO IP Statistics Data Center is the on-line service enabling access to WIPO's statistical data.

The WIPO Statistical Country Profiles provide IP information for around 190 countries.
 

 Yearly Reviews

PDF, Hague Yearly Review: International Registrations of Industrial Designs, 2014 edition

Hague Yearly
Review:
International Registrations
of Industrial Designs

  • Download report PDF, Hague Yearly Review: International Registrations of Industrial Designs, 2013 edition
  • Download data & graphs [ZIP]
  • Archive
PDF, Madrid Yearly Review: International Registrations of Marks, 2014 edition

Madrid Yearly
Review:
International
Registrations of Marks

  • Download report PDF, Madrid Yearly Review: International Registrations of Marks, 2014 edition
  • Download data & graphs [ZIP]
  • Archive
PDF, PCT Yearly Review: Key facts and figures on the international patent system

PCT Yearly Review:
The International
Patent System

  • Download report PDF, PCT Yearly Review: Key facts and figures on the international patent system
  • Download data & graphs [ZIP]
  • Archive

Further Datasets

PCT System  
Top applicant's list XLSX
Historical data (1985-1999) ZIP
Madrid System  
Top applicant's list XLSX
Additional statistics HTML
Hague System  
Top applicant's list XLSX
Additional statistics HTML


Infographics

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