IPC Definitions - January 01, 2012
G01Q 60/02 - Definition
This group covers:
Methods or apparatus involving two or more different types of interactions between the scanning probe tip and the sample surface, e.g. cantilever-type SPMs other than AFM which are explicitly built for AFM performances.
The device can contain either one probe or more than one probe to perform different types of SPM over the sample.
Attention is drawn to the following places, which may be of interest for search:
Devices containing array of tips with similar performance function | G01Q 70/06 |