IPC Definitions - January 01, 2012
G01N 23/00 - Definition
This main group covers:
Investigating or analysing materials by the use of wave radiation of very short wavelength (high energy), i.e. with a wavelength typically of a few nanometres or less, e.g. X-rays, including synchrotron radiation.
Investigating or analysing materials by the use of particle radiation, e.g. neutrons, ions or electrons.
References relevant to classification in this main group
This main group does not cover:
Investigating strength properties of solid materials by application of mechanical stress | G01N 3/00 |
Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid | G01N 5/00 |
Analysing materials by measuring the pressure or volume of a gas or vapour | G01N 7/00 |
Investigatingdensity or specific gravity of materials; analysing materials by determining density or specific gravity | G01N 9/00 |
Investigating flow properties of materials, e.g. viscosity, plasticity; analysing materials by determining flow properties | G01N 11/00 |
Investigating surface or boundary effects, e.g. wetting power; investigating diffusion effects; analysing materials by determining surface, boundary, or diffusion effects | G01N 13/00 |
Investigating characteristics of particles; investigatingpermeability, pore-volume, or surface-area of porous materials | G01N 15/00 |
Investigating resistance of materials to the weather, to corrosion, or to light | G01N 17/00 |
Apparatus for medical or veterinary radiation diagnosis on the human or animal body, e.g. combined with radiation therapy equipment | A61B 6/00 |
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light | G01N 21/00 |
Investigating or analysing materials by the use of microwaves | G01N 22/00 |
Attention is drawn to the following places, which may be of interest for search:
Sampling; preparing specimens for investigation | G01N 1/00 |
Automatic analysis; handling materials therefore | G01N 35/00 |
Use of wave or particle radiation for measuring roughness or irregularity of surfaces, or for measuring the deformation in a solid | G01B 15/00 |
Measuring force or stress by the use of wave or particle radiation | G01L 1/25 |
Measurement of nuclear or X-radiation | G01T |
Prospecting or detecting by the use of nuclear radiation, e.g. of natural or induced radioactivity | G01V 5/00 |
Image analysis | G06T 7/00 |
Nuclear reactors | G21C |
Protection against X-radiation, gamma radiation, corpuscular radiation ;treating radioactively contaminated material | G21F |
Techniques for handling particles or electromagnetic radiation not otherwise provided for; gamma- or X-ray microscopes | G21K |
Electric discharge tubes or discharge lamps, e.g. X-ray tubes, electron microscopy | H01J, H01J 35/00, H01J 37/00 |
X-ray technique | H05G |