In this section, the following term is used with the meaning indicated:
"variable" (as a noun) means a feature or property (e.g., a dimension, a physical condition such as temperature, a quality such as density or colour) which, in respect of a particular entity (e.g., an object, a quantity of a substance, a beam of light) and at a particular instant, is capable of being measured; the variable may change, so that its numerical expression may assume different values at different times, in different conditions or in individual cases, but may be constant in respect of a particular entity in certain conditions or for practical purposes (e.g., the length of a bar may be regarded as constant for many purposes).
Attention is drawn to the definitions of terms or expressions used, appearing in the notes of several of the classes in this section, in particular those of "measuring" in class Fulltext... Hierarchy... Expanded...G01 and "control" and "regulation" in class Fulltext... Hierarchy... Expanded...G05.
Classification in this section may present more difficulty than in other sections, because the distinction between different fields of use rests to a considerable extent on differences in the intention of the user rather than on any constructional differences or differences in the manner of use, and because the subjects dealt with are often in effect systems or combinations, which have features or parts in common, rather than "things", which are readily distinguishable as a whole. For example, information (e.g., a set of figures) may be displayed for the purpose of education or advertising (Fulltext... Hierarchy... Expanded...G09), for enabling the result of a measurement to be known (Fulltext... Hierarchy... Expanded...G01), for signalling the information to a distant point or for giving information which has been signalled from a distant point (Fulltext... Hierarchy... Expanded...G08). The words used to describe the purpose depend on features that may be irrelevant to the form of the apparatus concerned, for example, such features as the desired effect on the person who sees the display, or whether the display is controlled from a remote point. Again, a device which responds to some change in a condition, e.g., in the pressure of a fluid, may be used, without modification of the device itself, to give information about the pressure (Fulltext... Hierarchy... Expanded...G01L) or about some other condition linked to the pressure (another subclass of class Fulltext... Hierarchy... Expanded...G01, e.g., Fulltext... Hierarchy... Expanded...G01K for temperature), to make a record of the pressure or of its occurrence (Fulltext... Hierarchy... Expanded...G07C), to give an alarm (Fulltext... Hierarchy... Expanded...G08B), or to control another apparatus (Fulltext... Hierarchy... Expanded...G05).
The classification scheme is intended to enable things of a similar nature (as indicated above) to be classified together. It is therefore particularly necessary for the real nature of any technical subject to be decided before it can be properly classified.
In this subclass, the following terms are used with the meaning indicated: [8]
"storage element" is an element which can hold at least one item of information and is provided with means for writing-in or reading-out this information; [8]
"memory" is a device, including storage elements, which can hold information to be extracted when desired. [8]
Input/output (I/O) data interface arrangements, e.g. I/O data control circuits, I/O data buffers (level conversion circuits in general Fulltext... Hierarchy... Expanded...H03K 19/0175) [7]
G11C 7/12
·
Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines [7]
G11C 7/14
·
Dummy cell management; Sense reference voltage generators [7]
G11C 7/16
·
Storage of analogue signals in digital stores using an arrangement comprising analogue/digital (A/D) converters, digital memories and digital/analogue (D/A) converters [7]
G11C 7/18
·
Bit line organisation; Bit line lay-out [7]
G11C 7/20
·
Memory cell initialisation circuits, e.g. when powering up or down, memory clear, latent image memory [7]
G11C 7/22
·
Read-write (R-W) timing or clocking circuits; Read-write (R-W) control signal generators or management [7]
G11C 7/24
·
Memory cell safety or protection circuits, e.g. arrangements for preventing inadvertent reading or writing; Status cells; Test cells [7]
using a sequential addressing device, e.g. shift register, counter (using first in first out (FIFO) registers for changing speed of digital data flow Fulltext... Hierarchy... Expanded...G06F 5/06; using last in first out (LIFO) registers for processing digital data by operating upon their order Fulltext... Hierarchy... Expanded...G06F 7/00) [5]
Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines [7]
G11C 8/10
·
Decoders [7]
G11C 8/12
·
Group selection circuits, e.g. for memory block selection, chip selection, array selection [7]
G11C 8/14
·
Word line organisation; Word line lay-out [7]
G11C 8/16
·
Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups [7]
G11C 8/18
·
Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe (RAS) or column address strobe (CAS) signals [7]
G11C 8/20
·
Address safety or protection circuits, i.e. arrangements for preventing unauthorized or accidental access [7]
using single-aperture storage elements, e.g. ring core; using multi-aperture plates in which each individual aperture forms a storage element
G11C 11/061
· · ·
using elements with single aperture or magnetic loop for storage, one element per bit, and for destructive read-out [2]
G11C 11/063
· · · ·
bit-organized, such as, 2L/2D-, 3D-organization, i.e. for selection of an element by means of at least two coincident partial currents both for reading and for writing [2]
G11C 11/065
· · · ·
word-organized, such as 2D-organization, or linear selection, i.e. for selection of all the elements of a word by means of a single full current for reading [2]
G11C 11/067
· · ·
using elements with single aperture or magnetic loop for storage, one element per bit, and for non-destructive read-out [2]
Safety or protection circuits, e.g. for preventing inadvertent or unauthorised reading or writing; Status cells; Test cells (protection of memory contents during checking or testing Fulltext... Hierarchy... Expanded...G11C 29/52) [7]
G11C 11/408
· · · · · · ·
Address circuits [5]
G11C 11/409
· · · · · · ·
Read-write (R-W) circuits [5]
G11C 11/4091
· · · · · · · ·
Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating [7]
Digital stores characterised by arrangements of cells having volatile and non-volatile storage properties for back-up when the power is down [5]
P:20
G11C 15/00
Digital stores in which information comprising one or more characteristic parts is written into the store and in which information is read-out by searching for one or more of these characteristic parts, i.e. associative or content-addressed stores (in which information is addressed to a specific location Fulltext... Hierarchy... Expanded...G11C 11/00) [2]
in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM [5]
G11C 17/12
· · ·
using field-effect devices [5]
G11C 17/14
·
in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM [5]
using cores with one aperture or magnetic loop [2]
G11C 19/06
· ·
using structures with a number of apertures or magnetic loops, e.g. transfluxors [2]
G11C 19/08
· ·
using thin films in plane structure [2]
G11C 19/10
· ·
using thin films on rods; with twistors [2]
G11C 19/12
·
using non-linear reactive devices in resonant circuits [2]
G11C 19/14
·
using magnetic elements in combination with active elements, e.g. discharge tubes, semiconductor elements (Fulltext... Hierarchy... Expanded...G11C 19/34 takes precedence) [2,7]
G11C 19/18
·
using capacitors as main elements of the stages [2]
using electromechanical delay lines, e.g. using a mercury tank
P:90
G11C 23/00
Digital stores characterised by movement of mechanical parts to effect storage, e.g. using balls; Storage elements therefor (storing by actuating contacts Fulltext... Hierarchy... Expanded...G11C 11/48)
P:80
G11C 25/00
Digital stores characterised by the use of flowing media; Storage elements therefor
P:110
G11C 27/00
Electric analogue stores, e.g. for storing instantaneous values
Dependent multiple arrays, e.g. multi-bit arrays [8]
G11C 29/30
· · · · ·
Accessing single arrays [8]
G11C 29/32
· · · · · ·
Serial access; Scan testing [8]
G11C 29/34
· · · · · ·
Accessing multiple bits simultaneously [8]
G11C 29/36
· · · ·
Data generation devices, e.g. data inverters [8]
G11C 29/38
· · · ·
Response verification devices [8]
G11C 29/40
· · · · ·
using compression techniques [8]
G11C 29/42
· · · · ·
using error correcting codes (ECC) or parity check [8]
G11C 29/44
· · · ·
Indication or identification of errors, e.g. for repair [8]
G11C 29/46
· · · ·
Test trigger logic [8]
G11C 29/48
· · ·
Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access (DMA) or using auxiliary access paths (external testing equipment Fulltext... Hierarchy... Expanded...G11C 29/56) [8]
G11C 29/50
· ·
Marginal testing, e.g. race, voltage or current testing [8]
G11C 29/52
·
Protection of memory contents; Detection of errors in memory contents [8]
G11C 29/54
·
Arrangements for designing test circuits, e.g. design for test (DFT) tools [8]
G11C 29/56
·
External testing equipment for static stores, e.g. automatic test equipment (ATE); Interfaces therefor [8]
P:150
G11C 99/00
Subject matter not provided for in other groups of this subclass [8]