IPC 7 English version H01J 33/00-H01J 40/20

IPC ⁷ English version

H01J 27/00 - H01J 31/68

H01J03300-H01J04020

H01J 41/00 - H01J 65/08

SECTION H – ELECTRICITY

H 01

BASIC ELECTRIC ELEMENTS

H 01 J

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

33/

Discharge tubes with provision for emergence of electrons or ions from the vessel (particle accelerators H05H); Lenard tubes

33/

Details

33/

Windows

35/

X-ray tubes (X-ray lasers H01S 4/00; X-ray technique in general H05G)

35/

Details

35/

Electrodes

35/

Cathodes

35/

Anodes; Anticathodes

35/

Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes

35/

Cooling non-rotary anodes

35/

Arrangements for concentrating, focusing, or directing the cathode ray

35/

Vessels; Containers; Shields associated therewith

35/

Windows

35/

Selection of substances for gas fillings; Means for obtaining or maintaining the desired pressure within the tube, e.g. by gettering

35/

specially designed for passing a very high current for a very short time, e.g. for flash operation

35/

Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof

35/

by rotation of the anode or anticathode

35/

by vibration, oscillation, reciprocation, or swash-plate motion of the anode or anticathode

35/

by deflection of the cathode ray

35/

Tubes wherein the X-rays are produced at or near the end of the tube or a part thereof, which tube or part has a small cross-section to facilitate introduction into a small hole or cavity

37/

Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof (H01J 33/00, H01J 40/00, H01J 41/00, H01J 47/00, H01J 49/00 take precedence; investigating or analysing surface structures in atomic ranges using scanning-probe techniques G01N 13/10, e.g. scanning tunnelling microscopy G01N 13/12; contactless testing of electronic circuits using electron beams G01R 31/305; details of scanning-probe apparatus, in general G12B 21/00) [2,5]

37/

Details

37/

Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement

37/

Electron- or ion-optical arrangements for separating electrons or ions according to their energy (particle separator tubes H01J 49/00) [3]

37/

Electron sources; Electron guns

37/

063

Geometrical arrangement of electrodes for beam-forming [3]

37/

065

Construction of guns or parts thereof (H01J 37/067 to H01J 37/077 take precedence) [3]

37/

067

Replacing parts of guns; Mutual adjustment of electrodes (H01J 37/073 to H01J 37/077 take precedence; vacuum locks H01J 37/18) [3]

37/

Eliminating deleterious effects due to thermal effects or electric or magnetic fields (H01J 37/073 to H01J 37/077 take precedence) [3]

37/

073

Electron guns using field emission, photo emission, or secondary emission electron sources [3]

37/

075

Electron guns using thermionic emission from cathodes heated by particle bombardment or by irradiation, e.g. by laser [3]

37/

077

Electron guns using discharge in gases or vapours as electron sources [3]

37/

Ion sources; Ion guns

37/

Diaphragms; Shields associated with electron- or ion-optical arrangements; Compensation of disturbing fields [3]

37/

Lenses

37/

electrostatic

37/

magnetic

37/

141

Electromagnetic lenses [3]

37/

143

Permanent magnetic lenses [3]

37/

145

Combinations of electrostatic and magnetic lenses [3]

37/

147

Arrangements for directing or deflecting the discharge along a desired path (lenses H01J 37/10) [2]

37/

External mechanical adjustment of electron- or ion-optical components (H01J 37/067, H01J 37/20 take precedence) [3]

37/

153

Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators [2]

37/

Vessels; Containers

37/

Vacuum locks

37/

Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support (preparing specimens for investigation G01N 1/28)

37/

Means for adjusting the focus [2]

37/

Optical or photographic arrangements associated with the tube

37/

Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for

37/

244

Detectors; Associated components or circuits therefor [3]

37/

248

Components associated with high voltage supply (high voltage supply in general H02J, H02M) [3]

37/

252

Tubes for spot-analysing by electron or ion beams; Microanalysers (investigating or analysing thereby G01N 23/22) [3]

37/

256

using scanning beams [3]

37/

Electron or ion microscopes; Electron- or ion-diffraction tubes [2]

37/

Shadow microscopy [3]

37/

with scanning beams (microanalysers using scanning beams H01J 37/256)

37/

285

Emission microscopes, e.g. field-emission microscopes [2]

37/

Reflection microscopes [2]

37/

295

Electron- or ion-diffraction tubes [2]

37/

Electron-beam or ion-beam tubes for localised treatment of objects

37/

301

Arrangements enabling beams to pass between regions of different pressure [3]

37/

302

Controlling tubes by external information, e.g. programme control (H01J 37/304 takes precedence) [3]

37/

304

Controlling tubes by information coming from the objects, e.g. correction signals [3]

37/

305

for casting, melting, evaporating, or etching [2]

37/

for cutting or drilling [2]

37/

315

for welding [2]

37/

317

for changing properties of the objects or for applying thin layers thereon, e.g. ion implantation (H01J 37/36 takes precedence) [3]

37/

Gas-filled discharge tubes (heating by discharge H05B)

37/

operating with cathodic sputtering (H01J 37/36 takes precedence) [3]

37/

for cleaning surfaces while plating with ions of materials introduced into the discharge, e.g. introduced by evaporation [3]

40/

Photoelectric discharge tubes not involving the ionisation of a gas (H01J 49/00 takes precedence; cathode-ray or image-pick-up tubes H01J 31/26) [3]

40/

Details [3]

40/

Electrodes [3]

40/

Photo-emissive cathodes [3]

40/

Magnetic means for controlling discharge [3]

40/

Selection of substances for gas fillings [3]

40/

One or more circuit elements structurally associated with the tube [3]

40/

Circuit arrangements not adapted to a particular application of the tube and not otherwise provided for [3]

40/

having photo-emissive cathode, e.g. alkaline photoelectric cell (operating with secondary emission H01J 43/00) [3]

40/

with luminescent coatings for influencing the sensitivity of the tube, e.g. by converting the input wavelength (image-conversion or image-amplification tubes H01J 31/50) [3]

40/

wherein a light-ray scans a photo-emissive screen [3]

H01J 27/00 - H01J 31/68

H01J 41/00 - H01J 65/08