IPC 7 English version G01R 22/00-G01R 31/44

IPC ⁷ English version

G01R 13/00 - G01R 21/14

G01R02200-G01R03144

G01R 33/00 - G01R 35/06

SECTION G – PHYSICS

G 01

MEASURING (counting G06M); TESTING

G 01 R

MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (measuring physical variables of any kind by conversion into electric variables, see Note (4) following the title of class G01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis, G01N; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods G01N; indicating correct tuning of resonant circuits H03J 3/12; monitoring electronic pulse counters H03K 21/40; monitoring operation of communication systems H04)

22/

Arrangements for measuring time integral of electric power or current, e.g. by electronic methods (electromechanical arrangements G01R 11/00; monitoring electric consumption of electrically-propelled vehicles B60L 3/00) [4]

Note

An arrangement for measuring time integral of electric power is classified in group G01R 21/00 if the essential characteristic is the measuring of electric power. [4]

22/

by electrolytic methods [4]

22/

by calorimetric methods [4]

23/

Arrangements for measuring frequencies; Arrangements for analysing frequency spectra (frequency discriminators H03D)

23/

Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage (measuring short time intervals G04F)

23/

adapted for measuring in circuits having distributed constants

23/

by converting frequency into an amplitude of current or voltage

23/

using response of circuits tuned on resonance, e.g. grid-drip meter [2]

23/

using response of circuits tuned off resonance

23/

using analogue integrators, e.g. capacitors establishing a mean value by balance of input signals and defined discharge signals or leakage (radiation-measuring instruments in which pulses generated by a radiation detector are integrated G01T 1/15) [2]

23/

by converting frequency into a train of pulses, which are then counted

23/

by converting frequency into phase shift

23/

by heterodyning; by beat-frequency comparison (generation of oscillations by beating unmodulated signals of different frequencies H03B 21/00) [2]

23/

Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements [3]

23/

Spectrum analysis; Fourier analysis

23/

163

adapted for measuring in circuits having distributed constants [3]

23/

165

using filters [3]

23/

167

with digital filters [3]

23/

with optical auxiliary devices [3]

23/

173

Wobbulating devices similar to swept panoramic receivers (panoramic receivers per se H03J 7/32) [3]

23/

175

by delay means, e.g. tapped delay lines [3]

23/

177

Analysis of very low frequencies [3]

23/

with provision for recording frequency spectrum

23/

Measurement of non-linear distortion

25/

Arrangements for measuring phase angle between a voltage and a current or between voltages or currents (measuring power factor G01R 21/00; measuring position of individual pulses in a pulse train G01R 29/02; phase discriminators H03D) [2]

25/

in circuits having distributed constants

25/

involving adjustment of a phase shifter to produce a predetermined phase difference, e.g. zero difference

25/

employing quotient instrument

25/

by counting of standard pulses (measuring time intervals G04F) [2]

27/

Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

27/

Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant (by measuring phase angle only G01R 25/00)

27/

in circuits having distributed constants

27/

Measuring reflection coefficients; Measuring standing-wave ratio

27/

Measuring resistance by measuring both voltage and current

27/

using two-coil or crossed-coil instruments forming quotient

27/

using hand generators, e.g. meggers

27/

Measuring resistance by measuring current or voltage obtained from a reference source (G01R 27/16, G01R 27/20, G01R 27/22 take precedence)

27/

Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line

27/

Measuring resistance to earth

27/

Measuring earth resistance; Measuring contact resistance of earth connections, e.g. plates

27/

Measuring resistance of fluids (measuring vessels, electrodes therefor G01N 27/07)

27/

Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants

27/

Measuring attenuation, gain, phase shift, or derived characteristics of electric four-pole networks, i.e. two-port networks; Measuring transient response (in line transmission systems H04B 3/46)

27/

with provision for recording characteristics, e.g. by plotting Nyquist diagram

27/

in circuits having distributed constants [2]

29/

Arrangements for measuring or indicating electric quantities not covered by groups G01R 19/00 to G01R 27/00

29/

Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time, duration (of amplitude G01R 19/00; of repetition rate G01R 23/00; of phase difference of two cyclic pulse trains G01R 25/00; monitoring pattern of pulse trains H03K 5/19) [3]

29/

027

Indicating that a pulse characteristic is either above or below a predetermined value or within or beyond a predetermined range of values [3]

29/

033

giving an indication of the number of times this occurs [3]

29/

Measuring form factor, i.e. quotient of root-mean-square value and arithmetic mean of instantaneous value; Measuring peak factor, i.e. quotient of maximum value and root-mean-square value

29/

Measuring depth of modulation

29/

Measuring electromagnetic field characteristics

29/

Radiation diagrams of aerials

29/

Measuring electrostatic fields

29/

Measuring field distribution

29/

Measuring asymmetry of polyphase networks

29/

Indicating phase sequence; Indicating synchronism

29/

Measuring number of turns; Measuring transformation ratio or coupling factor of windings (calibrating instrument transformers G01R 35/02)

29/

Measuring piezo-electric properties

29/

Arrangements for measuring quantities of charge (electrostatic instruments G01R 5/28; indicating presence of current G01R 19/15; electrolytic meters, calorimetric meters, for measuring time integral of electric current G01R 22/02, G01R 22/04) [2]

29/

Measuring noise figure; Measuring signal-to-noise ratio [2]

31/

Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (measuring leads, measuring probes G01R 1/06; indicating electrical condition of switchgear or protective devices H01H 71/04, H01H 73/12, H02B 11/10, H02H 3/04; testing or measuring semiconductors or solid state devices during manufacture H01L 21/66; testing line transmission systems H04B 3/46)

31/

Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (G01R 31/18 takes precedence) [6]

31/

Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection

31/

Testing connections, e.g. of plugs, of non-disconnectable joints

31/

Testing of electric windings, e.g. for polarity (measuring number of turns, transformation ratio, or coupling factor G01R 29/20)

31/

Testing of fuses (means for indicating condition of fuse structurally associated with the fuse H01H 85/30) [6]

31/

Locating faults in cables, transmission lines, or networks (emergency protective circuit arrangements H02H)

31/

by increasing destruction at fault, e.g. burning-in by using a pulse generator operating a special programme

31/

using pulse-reflection methods

31/

Testing dielectric strength or breakdown voltage

31/

Circuits therefor

31/

Construction of testing vessels; Electrodes therefor

31/

Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production

31/

Preparation of articles or specimens to facilitate testing

31/

Testing of discharge tubes (during manufacture H01J 9/42) [2]

31/

Testing of vacuum tubes [2]

31/

Testing of individual semiconductor devices (measurement of impurity content of materials G01N) [2]

31/

265

Contactless testing [6]

31/

Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements [6]

31/

Testing of electronic circuits, e.g. by signal tracer (testing for short-circuits, discontinuities, leakage or incorrect line connection G01R 31/02; checking computers G06F 11/00; checking static stores for correct operation G11C 29/00)

31/

Marginal testing, e.g. by varying supply voltage (marginal testing of computers G06) [2]

31/

302

Contactless testing (non contact-making probes G01R 1/07) [5]

31/

303

of integrated circuits (G01R 31/305 to G01R 31/315 take precedence) [6]

31/

304

of printed or hybrid circuits (G01R 31/305 to G01R 31/315 take precedence) [6]

31/

305

using electron beams [5]

31/

306

of printed or hybrid circuits [6]

31/

307

of integrated circuits [6]

31/

308

using non-ionising electromagnetic radiation, e.g. optical radiation [5]

31/

309

of printed or hybrid circuits [6]

31/

311

of integrated circuits [6]

31/

312

by capacitive methods [5]

31/

315

by inductive methods [5]

31/

316

Testing of analog circuits [6]

31/

3161

Marginal testing [6]

31/

3163

Functional testing [6]

31/

3167

Testing of combined analog and digital circuits [6]

31/

317

Testing of digital circuits [6]

31/

3173

Marginal testing [6]

31/

3177

Testing of logic operation, e.g. by logic analysers [6]

31/

3181

Functional testing (G01R 31/3177 takes precedence) [6]

31/

3183

Generation of test inputs, e.g. test vectors, patterns or sequences [6]

31/

3185

Reconfiguring for testing, e.g. LSSD, partitioning [6]

31/

3187

Built-in tests [6]

31/

319

Tester hardware, i.e. output processing circuits [6]

31/

3193

with comparison between actual response and known fault-free response [6]

31/

327

Testing of circuit interrupters, switches or circuit-breakers (structural association with switches H01H) [6]

31/

333

Testing of the switching capacity of high-voltage circuit-breakers (means for detecting the presence of an arc or discharge in switching devices H01H 9/50, H01H 33/26) [6]

31/

Testing dynamo-electric machines (testing electric windings G01R 31/06; methods or apparatus specially adapted for manufacturing, assembling, maintaining or repairing dynamo-electric machines H02K 15/00) [3]

31/

Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition (accumulators combined with arrangements for measuring, testing or indicating condition H01M 10/48; circuit arrangements for charging, or depolarising batteries or for supplying loads from batteries H02J 7/00) [3]

31/

Testing of sparking-plugs (testing non-electrical properties G01M 19/02) [6]

31/

Testing power supplies [6]

31/

AC power supplies [6]

31/

Testing lamps (discharge lamps G01R 31/24; structurally associated with light source circuit arrangements for detecting lamp failure H05B 37/03) [6]

G01R 13/00 - G01R 21/14

G01R 33/00 - G01R 35/06