(0)G01N:4/9:
IPC6
SECTION G - PHYSICS
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR...
G01N
5/10
<<   >>   G01N022/00 - G01N024/14  

22
/ 00 Investigating or analysing materials by the use of microwaves (G 01 N 3/00 to G 01 N 17/00, G 01 N 24/00 take precedence) [3]

22
/ 02 Investigating the presence of flaws [3]  

22
/ 04 Investigating moisture content [3]  
 

23
/ 00 Investigating or analysing materials by the use of wave or particle radiation not covered by group G 01 N 21/00 or G 01 N 22/00, e.g. X-rays, neutrons (G 01 N 3/00 to G 01 N 17/00 take precedence; measuring stress in general G 01 L 1/00; measurement of nuclear or X-radiation G 01 T; introducing objects or materials into nuclear reactors, or removing them therefrom, or storing them after treatment therein G 21 C; construction or operation of X-ray apparatus or circuits therefor H 05 G)

23
/ 02 by transmitting the radiation through the material  

23
/ 04 and forming a picture (electron microscopes H 01 J)  

23
/ 05 using neutrons [3]  

23
/ 06 and measuring the absorption  

23
/ 08 using electric detection means  

23
/ 083 the radiation being X-rays (G 01 N 23/10 to G 01 N 23/18 take precedence) [5]  

23
/ 087 using polyenergetic X-rays [5]  

23
/ 09 the radiation being neutrons [3]  

23
/ 10 the material being confined in a container (G 01 N 23/09 takes precedence) [3]  

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/ 12 the material being a flowing fluid or a flowing granular solid (G 01 N 23/09 takes precedence) [3]  

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/ 14 specially adapted for controlling or monitoring operations or for signalling  

23
/ 16 the material being a moving sheet (G 01 N 23/09, G 01 N 23/18 take precedence) [3]  

23
/ 18 Investigating the presence of flaws or inclusions (G 01 N 23/09 takes precedence) [3,5]  

23
/ 20 by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation  

23
/ 201 by measuring small-angle scattering [2]  

23
/ 202 using neutrons [3]  

23
/ 203 by measuring back scattering  [2]  

23
/ 204 using neutrons [3]  

23
/ 205 by means of diffraction cameras (G 01 N 23/201 takes precedence)  [2]  

23
/ 206 the radiation being neutrons [3]  

23
/ 207 by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions (G 01 N 23/201 takes precedence; spectrometry of detected or measured radiation intensity G 01 T 1/36)  [2]  

23
/ 22 by measuring secondary emission  [2]  

23
/ 221 by activation analysis  [2]  

23
/ 222 using neutrons [3]  

23
/ 223 by irradiating the sample with X-rays and by measuring X-ray fluorescence  [2]  

23
/ 225 using electron or ion microprobe (electron or ion-beam tubes for microprobe analysis H 01 J 37/00)  [2]  

23
/ 227 by measuring photoelectric effect, e.g. Auger electrons [2]  
 

24
/ 00 Investigating or analysing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects (arrangements or instruments for measuring magnetic resonance effects G 01 R 33/20) [3,4,5]

24
/ 08 by using nuclear magnetic resonance (G 01 N 24/12 takes precedence) [3]  

24
/ 10 by using electron paramagnetic resonance (G 01 N 24/12 takes precedence) [3]  

24
/ 12 by using double resonance [3]  

24
/ 14 by using cyclotron resonance [3]  

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